Related Books
Language: en
Pages: 477
Pages: 477
Type: BOOK - Published: 2006-05-24 - Publisher: Springer Science & Business Media
This book presents materials fundamentals of novel gate dielectrics that are being introduced into semiconductor manufacturing to ensure the continuous scalling
Language: en
Pages: 676
Pages: 676
Type: BOOK - Published: 2007 - Publisher: The Electrochemical Society
This issue covers in detail all aspects of the physics and the technology of high dielectric constant gate stacks, including high mobility substrates, high diel
Language: en
Pages: 259
Pages: 259
Type: BOOK - Published: 2020-12-18 - Publisher: CRC Press
This volume explores and addresses the challenges of high-k gate dielectric materials, one of the major concerns in the evolving semiconductor industry and the
Language: en
Pages: 125
Pages: 125
Type: BOOK - Published: 2016-06-06 - Publisher: BoD – Books on Demand
After many decades, the scaling of silicon dioxide based field-effect transistors has reached insurmountable physical limits due unintentional high gate leakage
Language: en
Pages: 740
Pages: 740
Type: BOOK - Published: 2005 - Publisher: Springer Science & Business Media
Issues relating to the high-K gate dielectric are among the greatest challenges for the evolving International Technology Roadmap for Semiconductors (ITRS). Mor