Held in Guam in November of 2002, the symposium on the test technologies and research issues related to silicon chip production, resulted in the 74 papers prese

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk

The Asian Test Symposium provides an international forum for engineers and researchers from all countries of the World, especially from Asia, to present and dis

This book describes efficient techniques for production testing as well as for periodic maintenance testing (specifically in terms of multi-cell faults) in mode