This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreli

This book collects select chapters on modern industrial problems related to uncertainties and vagueness in the expert domain of knowledge. The book further prov

This book investigates the possible circuit solutions to overcome the temperature and supply voltage-sensitivity of fully-integrated time references for ultra-l

The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to Novembe

This book highlights key design issues and challenges to guarantee the development of successful applications of analog circuits. Researchers around the world s