Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra

Download or read book Analyzing Materials Using Joint X-ray Fluorescence and Diffraction Spectra written by Anton I. Mikhailov and published by Cambridge Scholars Publishing. This book was released on 2019-11-25 with total page 250 pages. Available in PDF, EPUB and Kindle. Book excerpt: This book presents a complex approach to material composition determination based on the analysis of the joint X-ray spectrum, including fluorescence, scattering, and diffraction reflections. It considers fluorescence, scattered, and diffracted radiations within the common problem of analytical spectrum formation. The complex methods for analyzing the material composition by joint spectra of fluorescence, Compton scattering and diffraction proposed here allow for a widening of the area of the application of X-ray methods. The book will be useful for specialists in the field of solid state physics, as well as advanced and post-graduate students.