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Language: en
Pages: 411
Pages: 411
Type: BOOK - Published: 2012-08-27 - Publisher: Springer Science & Business Media
Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful
Language: en
Pages: 418
Pages: 418
Type: BOOK - Published: 2016-05-30 - Publisher: Academic Press
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and pra
Language: en
Pages: 247
Pages: 247
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small vol
Language: en
Pages: 437
Pages: 437
Type: BOOK - Published: 2014-07-31 - Publisher: Springer
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomogra
Language: en
Pages: 546
Pages: 546
Type: BOOK - Published: 1996 - Publisher:
This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a uniq