Growth, Characterization and Device Processing of GaN Metal Oxide Semiconductor Field Effect Transistor (MOSFET) Structures
| Author | : Yoganand Nrusimha Saripalli |
| Publisher | : |
| Total Pages | : 208 |
| Release | : 2005 |
| ISBN-10 | : OCLC:62874115 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Growth, Characterization and Device Processing of GaN Metal Oxide Semiconductor Field Effect Transistor (MOSFET) Structures by : Yoganand Nrusimha Saripalli
Download or read book Growth, Characterization and Device Processing of GaN Metal Oxide Semiconductor Field Effect Transistor (MOSFET) Structures written by Yoganand Nrusimha Saripalli and published by . This book was released on 2005 with total page 208 pages. Available in PDF, EPUB and Kindle. Book excerpt: Keywords: Selected Area Regrowth, Reactive Ion Etching, MOSFETs, MOCVD, Epitaxial Growth, Low Temperature Regrowth, HFETs, GaN, Ohmic Contacts, Enhancement Mode GaN MOSFET.
