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Language: en
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Type: BOOK - Published: 2000-01-25 - Publisher: World Scientific
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Language: en
Pages: 616
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Type: BOOK - Published: 1989-04-18 - Publisher: John Wiley & Sons
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits
Language: en
Pages: 432
Pages: 432
Type: BOOK - Published: 2018-09-03 - Publisher: CRC Press
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Language: en
Pages: 349
Pages: 349
Type: BOOK - Published: 2004-07-29 - Publisher: World Scientific
This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis
Language: en
Pages: 424
Pages: 424
Type: BOOK - Published: 2013-11-11 - Publisher: Springer Science & Business Media
This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling