In the realm of semiconductor manufacturing, detecting anomalies during manufacturing processes is crucial. However, current methods of anomaly detection often

This book introduces the latest research on advanced control charts and new machine learning approaches to detect abnormalities in the smart manufacturing proce

This book provides in-depth insights into use cases implementing artificial intelligence (AI) applications at the edge. It covers new ideas, concepts, research,

With the rapid rise in the ubiquity and sophistication of Internet technology and the accompanying growth in the number of network attacks, network intrusion de