Manufacturing Yield Evaluation of VLSI/WSI Systems
| Author | : Bruno Ciciani |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 452 |
| Release | : 1995 |
| ISBN-10 | : STANFORD:36105017258877 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Manufacturing Yield Evaluation of VLSI/WSI Systems by : Bruno Ciciani
Download or read book Manufacturing Yield Evaluation of VLSI/WSI Systems written by Bruno Ciciani and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1995 with total page 452 pages. Available in PDF, EPUB and Kindle. Book excerpt: A practical understanding of these concepts and their application can help to reduce the chance of having device failures.
