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Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement
Language: en
Pages: 64
Authors: Ramon L. Jesch
Categories: Integrated circuits
Type: BOOK - Published: 1975 - Publisher:

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A detailed, applications-oriented description of a measurement technique that characterizes a high-frequency probe assembly for integrated circuit measurements
Characterization of a High Frequency Probe Assembly for Integrated Circuits Measurements
Language: en
Pages: 52
Authors: R. L.. Jesch
Categories:
Type: BOOK - Published: 1975 - Publisher:

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Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements (Classic Reprint)
Language: en
Pages: 66
Authors: Ramon L. Jesch
Categories: Mathematics
Type: BOOK - Published: 2018-01-10 - Publisher: Forgotten Books

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Excerpt from Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements The work performed during the period September 1972 to July
Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurement
Language: en
Pages: 64
Authors: Ramon L. Jesch
Categories: Integrated circuits
Type: BOOK - Published: 1975 - Publisher:

DOWNLOAD EBOOK

A detailed, applications-oriented description of a measurement technique that characterizes a high-frequency probe assembly for integrated circuit measurements
Characterization of High Frequency Probe Assembly for Integrated Circuit Measurements [with List of References
Language: en
Pages: 52