Current Collapse and Device Degradation in AlGaN/GaN Heterostructure Field Effect Transistors
| Author | : Daniel Balaz |
| Publisher | : |
| Total Pages | : 157 |
| Release | : 2010 |
| ISBN-10 | : OCLC:733243021 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Current Collapse and Device Degradation in AlGaN/GaN Heterostructure Field Effect Transistors by : Daniel Balaz
Download or read book Current Collapse and Device Degradation in AlGaN/GaN Heterostructure Field Effect Transistors written by Daniel Balaz and published by . This book was released on 2010 with total page 157 pages. Available in PDF, EPUB and Kindle. Book excerpt:
