"This book covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circui

This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design a

This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integra

Over the past few decades, devices and technologies have been significantly miniaturized from one generation to the next, providing far more potential in a much

This Open Access book introduces readers to many new techniques for enhancing and optimizing reliability in embedded systems, which have emerged particularly wi