This book is intended for readers who are interested in the design of robust and reliable electronic digital systems. The authors cover emerging trends in desig

As the complexity and the density of VLSI chips increase with shrinking design rules, the evaluation of long-term reliability of MOS VLSI circuits is becoming a

In order to increase the circuit density and speed of VLSI systems, microelectronic device geometry is shrinking from a few microns to submicron and beyond. Thi