17th IEEE VLSI Test Symposium
| Author | : |
| Publisher | : Institute of Electrical & Electronics Engineers(IEEE) |
| Total Pages | : 534 |
| Release | : 1999 |
| ISBN-10 | : 076950146X |
| ISBN-13 | : 9780769501468 |
| Rating | : 4/5 (468 Downloads) |
Book Synopsis 17th IEEE VLSI Test Symposium by :
Download or read book 17th IEEE VLSI Test Symposium written by and published by Institute of Electrical & Electronics Engineers(IEEE). This book was released on 1999 with total page 534 pages. Available in PDF, EPUB and Kindle. Book excerpt: The theme of the April 1999 symposium Scaling deeper to submicron: test technology challenges reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored
