Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements (Classic Reprint)

Download or read book Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements (Classic Reprint) written by Ramon L. Jesch and published by Forgotten Books. This book was released on 2018-01-10 with total page 64 pages. Available in PDF, EPUB and Kindle. Book excerpt: Excerpt from Characterization of a High Frequency Probe Assembly for Integrated Circuit Measurements The work performed during the period September 1972 to July 1973 was reported in nbs Special Publication 400-5, Semiconductor Measurement Technology: Measurement of Trans istor Scattering Parameters This special publication describes the results of the interlaboratory comparison of transistor S - parameter measurements and shows how the equiva lent circuit of the HF probe assemblies can be characterized by means of S-parameters using previously - described techniques. About the Publisher Forgotten Books publishes hundreds of thousands of rare and classic books. Find more at www.forgottenbooks.com This book is a reproduction of an important historical work. Forgotten Books uses state-of-the-art technology to digitally reconstruct the work, preserving the original format whilst repairing imperfections present in the aged copy. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in our edition. We do, however, repair the vast majority of imperfections successfully; any imperfections that remain are intentionally left to preserve the state of such historical works.