Electromigration and Electronic Device Degradation
| Author | : A. Christou |
| Publisher | : Wiley-Interscience |
| Total Pages | : 370 |
| Release | : 1994 |
| ISBN-10 | : UOM:39015029116350 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Electromigration and Electronic Device Degradation by : A. Christou
Download or read book Electromigration and Electronic Device Degradation written by A. Christou and published by Wiley-Interscience. This book was released on 1994 with total page 370 pages. Available in PDF, EPUB and Kindle. Book excerpt: Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.
