Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements
| Author | : Suat Eng Tan |
| Publisher | : |
| Total Pages | : 382 |
| Release | : 1997 |
| ISBN-10 | : OCLC:969701808 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements by : Suat Eng Tan
Download or read book Evaluation of Hot-carrier Degradation in Submicrometre MOSFETs by Gate Capacitance and Charge Pumping Current Measurements written by Suat Eng Tan and published by . This book was released on 1997 with total page 382 pages. Available in PDF, EPUB and Kindle. Book excerpt:
