Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures
| Author | : Sherry Shu Ting Yao |
| Publisher | : |
| Total Pages | : 200 |
| Release | : 2000 |
| ISBN-10 | : OCLC:48404393 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures by : Sherry Shu Ting Yao
Download or read book Evaluation of Hot-carrier Induced Degradation in MOSFETs by Measurement at Cryogenic Temperatures written by Sherry Shu Ting Yao and published by . This book was released on 2000 with total page 200 pages. Available in PDF, EPUB and Kindle. Book excerpt:
