During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these mat

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of m

During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industr

Hardly any other discovery of the nineteenth century did have such an impact on science and technology as Wilhelm Conrad Röntgen’s seminal find of the X-rays