Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits
| Author | : Kenneth Michael Butler |
| Publisher | : |
| Total Pages | : 294 |
| Release | : 1990 |
| ISBN-10 | : OCLC:24387703 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits by : Kenneth Michael Butler
Download or read book Techniques for assessing fault model and test quality in automatic test pattern generation for integrated circuits written by Kenneth Michael Butler and published by . This book was released on 1990 with total page 294 pages. Available in PDF, EPUB and Kindle. Book excerpt:
