Ultra-Low Voltage Nano-Scale Memories

Ultra-Low Voltage Nano-Scale Memories
Author :
Publisher : Springer Science & Business Media
Total Pages : 351
Release :
ISBN-10 : 9780387688534
ISBN-13 : 0387688536
Rating : 4/5 (536 Downloads)

Book Synopsis Ultra-Low Voltage Nano-Scale Memories by : Kiyoo Itoh

Download or read book Ultra-Low Voltage Nano-Scale Memories written by Kiyoo Itoh and published by Springer Science & Business Media. This book was released on 2007-09-04 with total page 351 pages. Available in PDF, EPUB and Kindle. Book excerpt: Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone market and to offset a significant increase in the power dissipation of high-end microprocessor units. The goal of this book is to provide a detailed explanation of the state-of-the-art nanometer and sub-1-V memory LSIs that are playing decisive roles in power conscious systems. Emerging problems between the device, circuit, and system levels are systematically discussed in terms of reliable high-speed operations of memory cells and peripheral logic circuits. The effectiveness of solutions at device and circuit levels is also described at length through clarifying noise components in an array, and even essential differences in ultra-low voltage operations between DRAMs and SRAMs.


Ultra-Low Voltage Nano-Scale Memories Related Books

Ultra-Low Voltage Nano-Scale Memories
Language: en
Pages: 351
Authors: Kiyoo Itoh
Categories: Technology & Engineering
Type: BOOK - Published: 2007-09-04 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Ultra-low voltage large-scale integrated circuits (LSIs) in nano-scale technologies are needed both to meet the needs of a rapidly growing mobile cell phone mar
Ultra-Low Voltage Nano-Scale Memories
Language: en
Pages: 357
Authors: Itoh
Categories:
Type: BOOK - Published: 2009-06-01 - Publisher:

DOWNLOAD EBOOK

Nanoscale Memory Repair
Language: en
Pages: 221
Authors: Masashi Horiguchi
Categories: Technology & Engineering
Type: BOOK - Published: 2011-01-11 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parame
Design for Manufacturability and Yield for Nano-Scale CMOS
Language: en
Pages: 277
Authors: Charles Chiang
Categories: Technology & Engineering
Type: BOOK - Published: 2007-06-15 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and
Low Power Design Essentials
Language: en
Pages: 371
Authors: Jan Rabaey
Categories: Technology & Engineering
Type: BOOK - Published: 2009-04-21 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

This book contains all the topics of importance to the low power designer. It first lays the foundation and then goes on to detail the design process. The book